andré ortoncelli
Federal Technological University of Paraná
Curitiba, Brazil
Review Editor
Pattern Recognition
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sudip paul
North Eastern Hill University
Shillong, India
Review Editor
Pattern Recognition
yingwei pan
JD.com
Beijing, China
Review Editor
Pattern Recognition
flavio piccoli
University of Milano-Bicocca
Milan, Italy
Review Editor
Pattern Recognition
ivan miguel pires
Instituto de Telecomunicações, Universidade da Beira Interior
CovilhĂŁ, Portugal
Review Editor
Pattern Recognition
antonio roberto
University of Salerno
Fisciano, Italy
Review Editor
Pattern Recognition
shabnam sadeghi esfahlani
Faculty of Science and Technology, Anglia Ruskin University
Chelmsford, United Kingdom
Review Editor
Pattern Recognition
dr. muhammad sajjad
Norwegian University of Science and Technology
Trondheim, Norway
Review Editor
Pattern Recognition
saman sarraf
Institute of Electrical and Electronics Engineers
New York, United States
Review Editor
Pattern Recognition
lucile sassatelli
Université Côte d'Azur
Nice, France
Review Editor
Pattern Recognition
sandeep singh sengar
Cardiff Metropolitan University
Cardiff, United Kingdom
Review Editor
Pattern Recognition
kapil k. sharma
D.Y. Patil University
Marathi, Maharashtra, India
Review Editor
Pattern Recognition
zhenghao shi
Xi'an University of Technology
Xi'an, China
Review Editor
Pattern Recognition
sven simon
University of Stuttgart
Stuttgart, Germany
Review Editor
Pattern Recognition
xuemeng song
Shandong University
Jinan, China
Review Editor
Pattern Recognition
paolo spagnolo
Institute of Applied Sciences and Intelligent Systems, Department of Physical Sciences and Technologies of Matter, National Research Council (CNR)
Pozzuoli, Italy
Review Editor
Pattern Recognition