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Articles

Original Research

Published on 04 Jan 2024

Investigation of laser-induced contamination on dielectric thin films in MHz sub-ps regime

in Optical Coatings and Metrology

Marek Stehlik
Janis Zideluns
Camille Petite
Valentin Allard
Marco Minissale
Antonin Moreau
Aude Lereu
Fabien Lemarchand
Frank Wagner
Julien Lumeau

Investigation of laser-induced contamination on dielectric thin films in MHz sub-ps regime

Advanced Optical Technologies

doi 10.3389/aot.2023.1261267

1,954 views

Review

Published on 25 Jul 2023

Deflectometry for specular surfaces: an overview

in Optical Coatings and Metrology

Jan Burke
Alexey Pak
Sebastian Höfer
Mathias Ziebarth
Masoud Roschani
Jürgen Beyerer

Deflectometry for specular surfaces: an overview

Advanced Optical Technologies

doi 10.3389/aot.2023.1237687

11,417 views
22 citations