ulrich h. p. fischer
Hochschule Harz University of Applied Sciences
Wernigerode, Germany
Review Editor
Optical Manufacturing and Design
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Review Editors
jiantuo gan
Xi'an Technological University
Xi'an, China
Review Editor
Optical Coatings and Metrology
shan gao
Harbin Engineering University
Harbin, China
Review Editor
Optical Imaging
zhan gao
Beijing Jiaotong University
Beijing, China
Review Editor
Optical Imaging
muhammad haider
King Fahd University of Petroleum and Minerals
Dhahran, Saudi Arabia
Review Editor
Optical Coatings and Metrology
wenjun he
Changchun University of Science and Technology
Changchun, China
Review Editor
Optical Imaging
andreas heinrich
Hochschule Aalen
Aalen, Germany
Review Editor
Optical Manufacturing and Design
andrew john henning
University of Huddersfield
Huddersfield, United Kingdom
Review Editor
Optical Coatings and Metrology
alois herkommer
University of Stuttgart
Stuttgart, Germany
Review Editor
Optical Manufacturing and Design
qingyu hou
Harbin Institute of Technology
Harbin, China
Review Editor
Optical Imaging
jin hu
Beijing Institute of Technology
Beijing, China
Review Editor
Optical Imaging
steven h. huang
Cornell University
Ithaca, United States
Review Editor
Applied Photonics
mirza karamehmedovic
Technical University of Denmark
Kongens Lyngby, Denmark
Review Editor
Applied Photonics
stefan karatodorov
Luxembourg Institute of Science and Technology (LIST)
Esch-sur-Alzette, Luxembourg
Review Editor
Optical Coatings and Metrology
ivan kassamakov
University of Helsinki
Helsinki, Finland
Review Editor
Optical Coatings and Metrology
se-ho kim
Korea University
Seoul, Republic of Korea
Review Editor
Optical Coatings and Metrology